SPIE PROMGRAMS ON AEROSPACE SCIENCE AND ENGINEERING
- Uncooled IR Focal Plane Arrays
- Imaging Detector Arrays
- Intoduction to Scientific
Charge-Coupled Devices
- Low Noise CCD Electronics
- Sensor Systems Engineering
- Fundamental Approach to IR Optical
Systems Design
Uncooled IR Focal Plane Arrays
Instructor: Paul W. Kruse received his
PhD in physics from the University of Notre Dame and most of his
career was spent at the Honeywell Technology Center, where he was
Chief Research.
Uncooled infrared focal plane arrays are true
technical breakthroughs which will enormously expand the military
and commercial markets for thermal imaging systems. Operating at
TV frame rates, these 80,000 pixel staring arrays offer thermal
sensitivities better than scanned linear arrays employing
cryogenic photon detectors. This course will describe the
principles of operation of uncooled arrays, including resistive
bolometric, ferroelectric bolometric, pyroelectric and
thermoelectric.
This course will enable you to:
- Describe their theoretical performance in
terms of their responsivity, noise, noise equivalent
temperature difference and response time
- Derive the fundamental limits to their
performance, including temperature fluctuation, noise and
background fluctuation noise
- Compare the fundamental limits of these
arrays with those of uncooled and cryogenic photon
detector arrays
- Compare theory with measured performance
of the uncooled arrays
- Summarize construction details from the
technical literature.
Part I: Introduction to Infrared Detectors and
Focal Plane Arrays
- Describe the role of infrared detectors
and arrays in systems
- Define figures of merit
- Classify infrared detection mechanisms
- Explain the principal thermal detection
mechanisms
- Explain the importance of thermal
isolation
- Identify performance limits
Part II: Uncooled Resistive Bolometer Focal
Plane Arrays
- Describe their detection mechanism
- Analyze their performance
- Review their state-of-the-art
Part III: Uncooled Pyroelectric and
Ferroelectric Bolometer Focal Plane Arrays
- Describe their detection mechanisms
- Analyze their performance
- Review their state-of-the-art
Part IV: Uncooled Thermoelectric Focal Plane
Arrays and Other Thermal Detection Approaches
- Describe their detection mechanisms
- Analyze their performance
- Review their state-of-the-art
Part V: Comparison of the Performance Limits of
Thermal and Photon Detector Arrays
- Describe the fundamental limits to the
performance of photon detectors
- Describe the fundamental limits to the
performance of thermal detectors
- Compare the cooling requirements of photon
and thermal detectors
Intended Audience: Engineers, scientists
and managers engaged in the development of infrared focal plane
arrays and the systems which employ them. It will also benefit
marketing personnel who are responsible for determining the
impact of uncooled IR focal plane arrays on present and future
products.
Order Number: VT120795
Length: 5 hours
Individual Price: List US$395
Site License: List US$1,000
Imaging Detector Arrays
Eustace L. Dereniak is a professor at
the Optical Sciences Center of the University of Arizona.
This course provides a broad and useful
background on the 2-D solid state electronic detector arrays,
with a special emphasis placed on the CCD visible and IR staring
sensor systems. Fundamentals of imaging detector arrays are
stressed, with discussions on hybrid focal plane arrays.
This course will enable you to:
- Evaluate whether solid state imagers are
practical for your application
- Determine shortcomings or limitations of
solid state imagers
- Evaluate sensitivity or expected
performance of sensor
- Determine required frame times for
different scenarios
- Assure optic design/CTD has appropriate
matching MTF
- Understand the trade-offs of aliasing.
Part I: Introduction: Two-Dimensional Arrays
- Explain significance of film
- Explain phenomenon of operation
- Describe optical detection processes
- Describe spectral characteristics
- Outline building block of array
Part II: Charge Transfer Processes
- Explain charge transfer efficiency
- Describe fat zero
- Define frame transfer
- Define interline transfer
- Define buried channel devices
Part III: Architecture
- Describe monolithic architecture
- Describe hybrid architecture
- Explain input circuits for hybrid
architecture
Part IV: Noise Processes
- Define temporal noises
- Define spatial non-conformity
- Define aliasing
Part V: Survey of Focal Plane Arrays
- Define the visible
- Define the infrared
- Define platinum silicide arrays
Intended Audience: Those who need to
learn more about two-dimensional arrays. It will give insight
into the optical detection process and show what is available to
application engineers.
Order Number: VT0892
Length: 5 hours
Individual Price: List US$395
Site License: List US$1,000
Introduction to Scientific Charge-Coupled Devices
James R. Janesick has been working at
the Jet Propulsion Laboratory at the California Institute of
Technology since 1973, developing scientific charge-coupled
devices.
This course is aimed at scientists, engineers,
and technical managers involved in calibrating, specifying and
characterizing charge-coupled devices (CCDs) that are used in
scientific imaging systems. The course focuses on the amazing
characteristics of CCDs, in particular:
- Pixel count (arrays as large as 4096 4096
have been fabricated)
- Quantum efficiency (spectral coverage of 1
to 11,000 A)
- Charge transfer efficiency (better than
99.9999 % efficient per pixel transfer)
- Read noise (less than 1 electron rms)
- Charge detection (3 electrons)
- Ultra-high dynamic range (greater than
1,000,000).
The course reviews the CCD technologies
responsible for such high levels of performance.
This course will allow you to:
- Become familiar with basic CCD imaging
theory, operation, fabrication, and large pixel array
layouts
- Have a sound practical understanding of
how CCDs are calibrated and characterized for scientific
imaging applications
- Understand critical CCD performance
characteristics
- Keep abreast of current CCD performance
limitations and state-of-the-art sensors.
Part I: Introduction: CCD Theory, Operation,
and Architecture
- Describe CCD theory and operation
- Define the photoelectric effect and the
CCD potential well
- List general CCD performance
characteristics
- Outline CCD fabrication and large pixel
imaging array architecture
Part II: Absolute CCD Calibration and
Characterization
- Describe absolute calibration using the
photon transfer technique
- Describe the X-ray transfer technique
- Summarize absolute photon standard methods
Part III: Quantum Efficiency and Charge
Collection Efficiency
- Define quantum efficiency
- Compare backside and frontside illuminated
CCDs
- Describe current quantum efficiency limits
- Define charge collection efficiency
- Describe charge collection efficiency
limits
Part IV: Charge Transfer Efficiency
- Define charge transfer efficiency
- Describe charge traps and their effect on
charge transfer efficiency performance
- Describe current charge transfer
efficiency limits
Part V: Charge Detection
- Describe CCD noise sources
- Describe low-noise signal processing
theory
- Describe sub-electron read noise
performance
Intended Audience: Engineers, scientists, and
technical managers working with and specifying CCDs employed in
scientific imaging systems.
Order Number: VT1092
Length: 5 hours
Individual Price: List US$395
Site License: List US$1,000
Low Noise CCD Electronics
Instructor: Thomas Ebben is a
senior design engineer at Ball Aerospace and Technologies Corp.,
where he has performed design, analysis, and simulation on a
variety of CCD electronic subsystems, including the CCD drive and
video processing electronics for the Hubble Space Telescope
second generation Imaging Spectrometer and Advanced Camera.
Charge-coupled devices (CCDs) are the
main imaging element in a variety of scientific and commercial
applications, including astronomical instruments such as the
Hubble Space Telescope, spectrometers, machine vision, medical
instruments, and broadcast cameras. The interaction between the
CCD and electronics is critical to achieve a quality image
characterized by low-noise and low-smear, and meet frame-rate and
linearity specifications. The intent of this course is to present
practical circuit applications and components, accompanied by
appropriate theory, so the attendee has the tools to begin the
electrical design of a working CCD imaging system. The course
emphasizes standard design practice: understand the problem,
propose a design, analyze the design using a appropriate math
tool, then prototype, test and verify.
This course will enable you to:
- Understand CCD specifications and device
physics that relate to electronics processing
- Create charge-flow diagrams to develop CCD
timing for basic readout, serial and parallel binning,
etc.
- Understand the operation of timing
generators and make tradeoffs between bit-period
resolution and storage space
- Design programmable and variable CCD bias
sources
- Model CCD clock phases as lumped and
distributed loads
- Design, simulate using SPICE, and test
clock drivers using the modeled CCD load
- Calculate the expected clock driver and
CCD static and dynamic power dissipation
- Design CCD preamplifiers and gain stages
- Understand the theory and design of
correlated double samplers
- Understand and specify analog-to-digital
converters
- Understand power distribution, grounding
schemes, and methods for rejecting power supply noise and
ripple
- Perform overall system noise analysis in
SPICE and in a spreadsheet
- Perform a complete electronics design
example, starting with the CCD specifications and system
requirements.
Part I: Introduction to CCD Electronics
- Outline the basics of CCDs
- Describe CCD construction
- List typical imaging system specifications
Part II: Timing Generators and Bias
Generators
- Explain timing generator theory
- Describe typical timing generator
implementations and tradeoffs
- Interpret charge-flow diagrams
- Explain generator theory and design
Part III: Clock Driver Theory
- Explain clock driver theory
- Describe distributed clock driver models
- Describe low-speed design example
- Describe high-speed design example
- Explain power dissipation analysis
Part IV: Video Processing Background
- Outline noise basics
- Explain noise in the CCD processing system
Part V: Video Processing Design
Techniques
- Show preamplifier design
- Explain correlated double sampler theory
and design
- Describe analogue to digital converters
Part VI: Video Processing Design
Techniques (cont.) and Introduction to System Analysis
- Explain power distribution, grounding, and
printed circuit board layout
- Describe system analysis techniques
- Explain methods for rejecting power supply
noise
Part VII: Video Processing System
Analysis and Lab Testing
- Perform system analysis using SPICE
- Test system in the lab setting
- Summarize contents of course
Intended Audience: Engineers,
scientists, technicians and managers who desire to understand the
details of CCD electronics design, and are interested in
real-world applications: what works and what doesn't.
Order Number: VT121196
Length: 7 hours
Individual Price: List US$535
Site License: List US$1,250
Sensor Systems Engineering
Richard J. Becherer is president and
founder of Delta Sciences of Stow, MA.
This course provides a tutorial introduction to
the design and engineering of passive and laser electro-optical
(EO) sensors in the infrared, visible, and ultraviolet range. You
will learn how fundamental principles can be applied to develop
practical solutions for present and future sensor systems.
This course will allow you to:
- Understand what EO sensor systems are all
about and how they work
- Understand basic optical principles that
critically impact sensor design
- Understand how the components of EO
sensors must interface to accomplish the design goal
- Understand how to apply top-level
requirements to the design of practical sensor systems
- Understand how passive and laser sensors
are modeled to accurately predict performance and do
design trades
- Understand the all-important step of
configuration selection
- Realize practical uses of sensor systems
in selected applications.
Part I: Introduction: What EO Sensor Systems
Are All About and How They Work
- Define basic EO sensor systems
- Explain fundamental optical phenomena of
radiation, photons, diffraction, interference, coherence,
and polarization and how they apply to sensors
- Describe key performance impact of
fundamental phenomena
- Identify candidate EO passive and laser
sensor configurations to exploit phenomena
Part II: How We Design, Analyze, and Configure
Practical EO Sensor Systems
- Show simple analysis methods for passive
and laser sensors with specific numerical examples
- Compare EO passive and laser sensors in
measurement objectives, capabilities and limitations,
complexity, and cost
- Identify and describe computer codes that
model EO sensors in various levels of detail
- Describe proven approaches to sensor
system configuration selection and design
Part III: What the State of the Art is in EO
Sensor Component Technology
- Describe how critical component technology
drives EO sensor performance
- Describe the rapidly evolving state of the
art in detectors and focal plane array technology
- Describe the state of the art in classical
and unconventional optics, new lasers (solid state,
diode, gas), scanners, and signal processing
- Identify component technology trends for
the future
Part IV: How Top Level Requirements are Applied
to Practical EO Sensor Design
- Explain and illustrate all important
requirements in the flowdown process
- Describe critical steps in creating
practical designs
Part V: Examples of Sensor Systems Applications
- Explain how requirements, design,
analysis, and technology are integrated for specific
applications
- Present example of passive sensor design
for surveillance, imaging, and recognition application
- Present example of laser sensor design for
imaging, Doppler velocity, and ranging application
Intended Audience: Persons who need to
learn more about EO sensor systems to complete current
assignments or to develop new capabilities. The course will be
useful to engineers, applied scientists, project managers, and to
those seeking new marketing directions.
Order Number: VT1192
Length: 5 hours
Individual Price: List US$395
Site License: List US$1,000
Fundamental Approach to IR Optical Systems Design
Max J. Riedl is currently technical
director of OFC corporation, Marlborough, MA, and has worked in
the field of optical instrumentation for more than 40 years. He
was formerly with Infrared Industries Inc. and Balzers Optical
Corp.
This video short course will provide practical
and directly applicable design and evaluation guidelines for the
initial IR optical layout phase. Simple but powerful expressions
will be developed and presented as approximations to predict
quickly expected system performance. Conventional and refractive
optical components and systems, and applications of diffractive
(binary) optics for the infrared spectrum will be discussed.
This course will enable you to:
- Understand basic radiometric and
fundamental optical design principles
- Evaluate whether a chosen optical system
will be a candidate for your application
- Determine advantages, shortcomings, and
limitations of optical configurations
- Predict 3rd order aberration effects on
image quality
- Estimate encircled energy blur spot size
and modulation transfer function (MTF)
- Speak more knowledgeably with seasoned
optical design experts regarding optical requirements.
Part I: Introduction: Radiometric Performance
- Outline and describe basic radiometer
optics
- Derive and explain simplified radiometric
performance equation
- Explain target and background radiations
- Describe transmittance through atmosphere
- Name typical IR detectors
- Demonstrate S/N calculation with examples
Part II: Basic Optics
- Define Snells Law
- Describe image formation
- Explain stops, pupils, and windows
- Combine aperture and field of view
- Explain optical gain
- Explain plane-parallel plate and wedge
Part III: Primary Aberrations, Lenses and Mirrors
- Describe primary aberrations
- Compute primary aberrations
- Compare configurations
- Diffraction limit
Part IV: Special Surfaces
- Explain conic sections and general
aspheres
- Compare mirrors and lenses
- Describe diffractive and binary elements
- Define Cassegrain configurations
- Explain thin film coatings
Part V: Image Evaluation
- Describe blur spot measurement
- Define encircled energy
- Present MTF approximation
Intended Audience: People who need to
learn more about optics as it relates to IR systems applications.
It will give the participant insight into radiation transfer and
image formation, and point out when it becomes necessary to
interface with an experienced lens designer.
Order Number: VT1293
Length: 5 hours
Individual Price: List US$395
Site License: List US$1,000
